Direct Probing of Trap Dynamics in β‐Ga2O3 Schottky Barrier Diodes Using Single‐Voltage‐Pulse Characterization.
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| Title: | Direct Probing of Trap Dynamics in β‐Ga2O3 Schottky Barrier Diodes Using Single‐Voltage‐Pulse Characterization. |
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| Authors: | Vo, Thanh Huong1,2, Kim, Sunjae1,3, Park, Ji‐Hyeon3, Jeon, Dae‐Woo3, Hwang, Wan Sik1,2, whwang@kau.ac.kr, Hwang, Jinyoung4, jinhwang@kau.ac.kr |
| Source: | Advanced Science; 3/3/2026, Vol. 13 Issue 13, p1-10, 10p |
| Database: | Applied Science & Technology Source |
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