Xie, X., Wang, Q., Fikry, M. M., Ogihara, S., & Yan, X. (2026). Grid-enhanced sampling moiré method for robust micro-deformation mapping under complex background noise. NDT & E International, 160, N.PAG. https://doi.org/10.1016/j.ndteint.2026.103663
Chicago Style (17th ed.) CitationXie, Xinyun, Qinghua Wang, M.J. Mohammad Fikry, Shinji Ogihara, and Xiaojun Yan. "Grid-enhanced Sampling Moiré Method for Robust Micro-deformation Mapping Under Complex Background Noise." NDT & E International 160 (2026): N.PAG. https://doi.org/10.1016/j.ndteint.2026.103663.
MLA (9th ed.) CitationXie, Xinyun, et al. "Grid-enhanced Sampling Moiré Method for Robust Micro-deformation Mapping Under Complex Background Noise." NDT & E International, vol. 160, 2026, p. N.PAG, https://doi.org/10.1016/j.ndteint.2026.103663.