APA (7th ed.) Citation

Kang, H., Guo, B., Luo, Y., & Shi, N. (2026). SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences. International Journal of Pattern Recognition & Artificial Intelligence, 40(6), 1. https://doi.org/10.1142/S0218001426500011

Chicago Style (17th ed.) Citation

Kang, Hongjuan, Bing Guo, Ying Luo, and Na Shi. "SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences." International Journal of Pattern Recognition & Artificial Intelligence 40, no. 6 (2026): 1. https://doi.org/10.1142/S0218001426500011.

MLA (9th ed.) Citation

Kang, Hongjuan, et al. "SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences." International Journal of Pattern Recognition & Artificial Intelligence, vol. 40, no. 6, 2026, p. 1, https://doi.org/10.1142/S0218001426500011.