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SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences.

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Title: SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences.
Authors: Kang, Hongjuan1,2, hongjuan.kang@changhong.com, Guo, Bing1, guobing@scu.edu.cn, Luo, Ying3, luoying0824@163.com, Shi, Na4, na.shi@changhong.com
Source: International Journal of Pattern Recognition & Artificial Intelligence; May2026, Vol. 40 Issue 6, p1-13, 13p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 192625311
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences.
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  Data: <searchLink fieldCode="AU" term="%22Kang%2C+Hongjuan%22">Kang, Hongjuan</searchLink><relatesTo>1,2</relatesTo>, <i>hongjuan.kang@changhong.com</i><br /><searchLink fieldCode="AU" term="%22Guo%2C+Bing%22">Guo, Bing</searchLink><relatesTo>1</relatesTo>, <i>guobing@scu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Luo%2C+Ying%22">Luo, Ying</searchLink><relatesTo>3</relatesTo>, <i>luoying0824@163.com</i><br /><searchLink fieldCode="AU" term="%22Shi%2C+Na%22">Shi, Na</searchLink><relatesTo>4</relatesTo>, <i>na.shi@changhong.com</i>
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Pattern+Recognition+%26+Artificial+Intelligence%22">International Journal of Pattern Recognition & Artificial Intelligence</searchLink>; May2026, Vol. 40 Issue 6, p1-13, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192625311
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1142/S0218001426500011
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 13
        StartPage: 1
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      – TitleFull: SIMD-Accelerated Optimization of Runs Test Performance on Binary Sequences.
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            NameFull: Kang, Hongjuan
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            NameFull: Guo, Bing
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            NameFull: Luo, Ying
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            – D: 01
              M: 05
              Text: May2026
              Type: published
              Y: 2026
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              Value: 40
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              Value: 6
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            – TitleFull: International Journal of Pattern Recognition & Artificial Intelligence
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