Ma, Y., Tian, Y., Tian, T., & Huang, J. (2026). Research on Ultrasonic Imaging of Defects in Insulating Materials Based on the SAFT. Applied Sciences (2076-3417), 16(5), 2400. https://doi.org/10.3390/app16052400
Chicago Style (17th ed.) CitationMa, Yukun, Yi Tian, Tian Tian, and Juntang Huang. "Research on Ultrasonic Imaging of Defects in Insulating Materials Based on the SAFT." Applied Sciences (2076-3417) 16, no. 5 (2026): 2400. https://doi.org/10.3390/app16052400.
MLA (9th ed.) CitationMa, Yukun, et al. "Research on Ultrasonic Imaging of Defects in Insulating Materials Based on the SAFT." Applied Sciences (2076-3417), vol. 16, no. 5, 2026, p. 2400, https://doi.org/10.3390/app16052400.
Warning: These citations may not always be 100% accurate.