Zeng, C., Li, M., Liu, F., Yang, X., Liu, J., & Yan, S. (2026). A Logic-Guided and Explainable Approach to LLM-Based Unit Test Generation. Applied Sciences (2076-3417), 16(5), 2542. https://doi.org/10.3390/app16052542
Chicago Style (17th ed.) CitationZeng, Cong, Meng Li, Fei Liu, Xiaohua Yang, Jie Liu, and Shiyu Yan. "A Logic-Guided and Explainable Approach to LLM-Based Unit Test Generation." Applied Sciences (2076-3417) 16, no. 5 (2026): 2542. https://doi.org/10.3390/app16052542.
MLA (9th ed.) CitationZeng, Cong, et al. "A Logic-Guided and Explainable Approach to LLM-Based Unit Test Generation." Applied Sciences (2076-3417), vol. 16, no. 5, 2026, p. 2542, https://doi.org/10.3390/app16052542.
Warning: These citations may not always be 100% accurate.