A Logic-Guided and Explainable Approach to LLM-Based Unit Test Generation.

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Title: A Logic-Guided and Explainable Approach to LLM-Based Unit Test Generation.
Authors: Zeng, Cong1, Li, Meng1,2,3, mlemon@usc.edu.cn, Liu, Fei1,3, Yang, Xiaohua1,2,3, Liu, Jie1,2,3, Yan, Shiyu1,2,3
Source: Applied Sciences (2076-3417); Mar2026, Vol. 16 Issue 5, p2542, 31p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 192636320
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192636320
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        Value: 10.3390/app16052542
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        Text: English
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              Text: Mar2026
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              Y: 2026
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