APA (7th ed.) Citation

Fiorino, F. M., Ruffino, F., & Catena, A. (2026). Investigation of Defect Propagation in 4H-SiC: From Substrate to Epitaxial Layers. Applied Sciences (2076-3417), 16(6), 2727. https://doi.org/10.3390/app16062727

Chicago Style (17th ed.) Citation

Fiorino, Francesco Maria, Francesco Ruffino, and Alberto Catena. "Investigation of Defect Propagation in 4H-SiC: From Substrate to Epitaxial Layers." Applied Sciences (2076-3417) 16, no. 6 (2026): 2727. https://doi.org/10.3390/app16062727.

MLA (9th ed.) Citation

Fiorino, Francesco Maria, et al. "Investigation of Defect Propagation in 4H-SiC: From Substrate to Epitaxial Layers." Applied Sciences (2076-3417), vol. 16, no. 6, 2026, p. 2727, https://doi.org/10.3390/app16062727.