APA (7th ed.) Citation

Hassan, M. A., Hassan, M., Sadek, A., & Lee, C. (2026). Focus to generalize (F2G): Physics-guided attention for sample efficient and generalizable deep learning defect detection. Journal of Intelligent Manufacturing, 37(5), 1789. https://doi.org/10.1007/s10845-025-02623-3

Chicago Style (17th ed.) Citation

Hassan, Mohamed Abubakr, Mahmoud Hassan, Ahmad Sadek, and Chi-Guhn Lee. "Focus to Generalize (F2G): Physics-guided Attention for Sample Efficient and Generalizable Deep Learning Defect Detection." Journal of Intelligent Manufacturing 37, no. 5 (2026): 1789. https://doi.org/10.1007/s10845-025-02623-3.

MLA (9th ed.) Citation

Hassan, Mohamed Abubakr, et al. "Focus to Generalize (F2G): Physics-guided Attention for Sample Efficient and Generalizable Deep Learning Defect Detection." Journal of Intelligent Manufacturing, vol. 37, no. 5, 2026, p. 1789, https://doi.org/10.1007/s10845-025-02623-3.