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Focus to generalize (F2G): physics-guided attention for sample efficient and generalizable deep learning defect detection.

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Title: Focus to generalize (F2G): physics-guided attention for sample efficient and generalizable deep learning defect detection.
Authors: Hassan, Mohamed Abubakr1,2,3, mahassan@mie.utoronto.ca, Hassan, Mahmoud2,3, mahmoud.hassan@cnrc-nrc.gc.ca, Sadek, Ahmad3, ahmad.sadek@cnrc-nrc.gc.ca, Lee, Chi-Guhn1,2, cglee@mie.utoronto.ca
Source: Journal of Intelligent Manufacturing; May2026, Vol. 37 Issue 5, p1789-1812, 24p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 193087647
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Intelligent+Manufacturing%22">Journal of Intelligent Manufacturing</searchLink>; May2026, Vol. 37 Issue 5, p1789-1812, 24p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193087647
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        Value: 10.1007/s10845-025-02623-3
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      – Code: eng
        Text: English
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        StartPage: 1789
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      – TitleFull: Focus to generalize (F2G): physics-guided attention for sample efficient and generalizable deep learning defect detection.
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            NameFull: Hassan, Mohamed Abubakr
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            NameFull: Hassan, Mahmoud
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            NameFull: Sadek, Ahmad
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            – D: 01
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              Text: May2026
              Type: published
              Y: 2026
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              Value: 37
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