Bibliographic Details
| Title: |
Analysis of spatial distribution of remnant polarization in inverted staggered a-IGZO/HZO ferroelectric thin-film transistor using capacitance-voltage characteristics. |
| Authors: |
Kim, Hwan Jin1, Yang, Hyojin1, Kim, Haesung2, Park, Sejun1, Lee, Ha-Neul1, Choi, Sung-Jin1, Kim, Dong Myong1, Kim, Dae Hwan1, Park, Min-Kyu1,3, mkpark@gachon.ac.kr, Bae, Jong-Ho1,4, jbae@yonsei.ac.kr |
| Source: |
Solid-State Electronics; Aug2026, Vol. 235, pN.PAG-N.PAG, 1p |
| Database: |
Applied Science & Technology Source |
