Analysis of spatial distribution of remnant polarization in inverted staggered a-IGZO/HZO ferroelectric thin-film transistor using capacitance-voltage characteristics.
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| Title: | Analysis of spatial distribution of remnant polarization in inverted staggered a-IGZO/HZO ferroelectric thin-film transistor using capacitance-voltage characteristics. |
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| Authors: | Kim, Hwan Jin1, Yang, Hyojin1, Kim, Haesung2, Park, Sejun1, Lee, Ha-Neul1, Choi, Sung-Jin1, Kim, Dong Myong1, Kim, Dae Hwan1, Park, Min-Kyu1,3, mkpark@gachon.ac.kr, Bae, Jong-Ho1,4, jbae@yonsei.ac.kr |
| Source: | Solid-State Electronics; Aug2026, Vol. 235, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193455574 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Analysis of spatial distribution of remnant polarization in inverted staggered a-IGZO/HZO ferroelectric thin-film transistor using capacitance-voltage characteristics. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Kim%2C+Hwan+Jin%22">Kim, Hwan Jin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Hyojin%22">Yang, Hyojin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Haesung%22">Kim, Haesung</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Park%2C+Sejun%22">Park, Sejun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lee%2C+Ha-Neul%22">Lee, Ha-Neul</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Choi%2C+Sung-Jin%22">Choi, Sung-Jin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dong+Myong%22">Kim, Dong Myong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dae+Hwan%22">Kim, Dae Hwan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Park%2C+Min-Kyu%22">Park, Min-Kyu</searchLink><relatesTo>1,3</relatesTo>, <i>mkpark@gachon.ac.kr</i><br /><searchLink fieldCode="AU" term="%22Bae%2C+Jong-Ho%22">Bae, Jong-Ho</searchLink><relatesTo>1,4</relatesTo>, <i>jbae@yonsei.ac.kr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Solid-State+Electronics%22">Solid-State Electronics</searchLink>; Aug2026, Vol. 235, pN.PAG-N.PAG, 1p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193455574 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.sse.2026.109358 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 1 StartPage: N.PAG Titles: – TitleFull: Analysis of spatial distribution of remnant polarization in inverted staggered a-IGZO/HZO ferroelectric thin-film transistor using capacitance-voltage characteristics. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kim, Hwan Jin – PersonEntity: Name: NameFull: Yang, Hyojin – PersonEntity: Name: NameFull: Kim, Haesung – PersonEntity: Name: NameFull: Park, Sejun – PersonEntity: Name: NameFull: Lee, Ha-Neul – PersonEntity: Name: NameFull: Choi, Sung-Jin – PersonEntity: Name: NameFull: Kim, Dong Myong – PersonEntity: Name: NameFull: Kim, Dae Hwan – PersonEntity: Name: NameFull: Park, Min-Kyu – PersonEntity: Name: NameFull: Bae, Jong-Ho IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 00381101 Numbering: – Type: volume Value: 235 Titles: – TitleFull: Solid-State Electronics Type: main |
| ResultId | 1 |
