EBSP: Evolving Bit Sparsity Patterns for Hardware-Friendly Inference of Quantized Deep Neural Networks.

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Title: EBSP: Evolving Bit Sparsity Patterns for Hardware-Friendly Inference of Quantized Deep Neural Networks.
Authors: Liu, Fangxin1,2, Zhao, Wenbo1, Wang, Zongwu1, Chen, Yongbiao1, He, Zhezhi1, Jing, Naifeng1, Liang, Xiaoyao1, Jiang, Li1,2,3
Source: DAC: Annual ACM/IEEE Design Automation Conference; 2022, Issue 59, p259-264, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 193907116
AccessLevel: 2
PubType: Conference
PubTypeId: conference
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  Data: EBSP: Evolving Bit Sparsity Patterns for Hardware-Friendly Inference of Quantized Deep Neural Networks.
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  Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; 2022, Issue 59, p259-264, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193907116
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      – Type: doi
        Value: 10.1145/3489517.3530660
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 259
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      – TitleFull: EBSP: Evolving Bit Sparsity Patterns for Hardware-Friendly Inference of Quantized Deep Neural Networks.
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            NameFull: Liu, Fangxin
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            NameFull: Zhao, Wenbo
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            NameFull: Wang, Zongwu
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            NameFull: Chen, Yongbiao
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            NameFull: He, Zhezhi
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            NameFull: Jing, Naifeng
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            NameFull: Liang, Xiaoyao
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            NameFull: Jiang, Li
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            – D: 01
              M: 01
              Text: 2022
              Type: published
              Y: 2022
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              Value: 59
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            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
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