BayesFT: Bayesian Optimization for Fault Tolerant Neural Network Architecture.
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| Title: | BayesFT: Bayesian Optimization for Fault Tolerant Neural Network Architecture. |
|---|---|
| Authors: | Ye, Nanyang1, ynylincoln@sjtu.edu.cn, Mei, Jingbiao2, jm2245@cam.ac.uk, Fang, Zhicheng1, fangzhicheng@sjtu.edu.cn, Zhang, Yuwen3, yuwen.zhang.20@ucl.ac.uk, Zhang, Ziqing2, zz404@cam.ac.uk, Wu, Huaying1, wuhuaying@sjtu.edu.cn, Liang, Xiaoyao1, liang-xy@sjtu.edu.cn |
| Source: | DAC: Annual ACM/IEEE Design Automation Conference; 2021, Issue 58, p487-492, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193960825 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: BayesFT: Bayesian Optimization for Fault Tolerant Neural Network Architecture. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Ye%2C+Nanyang%22">Ye, Nanyang</searchLink><relatesTo>1</relatesTo>, <i>ynylincoln@sjtu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Mei%2C+Jingbiao%22">Mei, Jingbiao</searchLink><relatesTo>2</relatesTo>, <i>jm2245@cam.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Fang%2C+Zhicheng%22">Fang, Zhicheng</searchLink><relatesTo>1</relatesTo>, <i>fangzhicheng@sjtu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Yuwen%22">Zhang, Yuwen</searchLink><relatesTo>3</relatesTo>, <i>yuwen.zhang.20@ucl.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Ziqing%22">Zhang, Ziqing</searchLink><relatesTo>2</relatesTo>, <i>zz404@cam.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Wu%2C+Huaying%22">Wu, Huaying</searchLink><relatesTo>1</relatesTo>, <i>wuhuaying@sjtu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Liang%2C+Xiaoyao%22">Liang, Xiaoyao</searchLink><relatesTo>1</relatesTo>, <i>liang-xy@sjtu.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; 2021, Issue 58, p487-492, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193960825 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/DAC18074.2021.9586115 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 487 Titles: – TitleFull: BayesFT: Bayesian Optimization for Fault Tolerant Neural Network Architecture. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Ye, Nanyang – PersonEntity: Name: NameFull: Mei, Jingbiao – PersonEntity: Name: NameFull: Fang, Zhicheng – PersonEntity: Name: NameFull: Zhang, Yuwen – PersonEntity: Name: NameFull: Zhang, Ziqing – PersonEntity: Name: NameFull: Wu, Huaying – PersonEntity: Name: NameFull: Liang, Xiaoyao IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: 2021 Type: published Y: 2021 Identifiers: – Type: issn-print Value: 0738100X Numbering: – Type: issue Value: 58 Titles: – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference Type: main |
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