Xing, W. W., Fan, W., Liu, Z., Yao, Y., & Hu, Y. (2024). KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology. DAC: Annual ACM/IEEE Design Automation Conference, 61, 1550. https://doi.org/10.1145/3649329.3657380
Chicago Style (17th ed.) CitationXing, Wei W., Weijian Fan, Zhuohua Liu, Yuan Yao, and Yuanqi Hu. "KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology." DAC: Annual ACM/IEEE Design Automation Conference 61 (2024): 1550. https://doi.org/10.1145/3649329.3657380.
MLA (9th ed.) CitationXing, Wei W., et al. "KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology." DAC: Annual ACM/IEEE Design Automation Conference, 61, 2024, p. 1550, https://doi.org/10.1145/3649329.3657380.