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KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology.

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Title: KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology.
Authors: Xing, Wei W.1, Fan, Weijian2,3, Liu, Zhuohua3, Yao, Yuan4, Hu, Yuanqi4
Source: DAC: Annual ACM/IEEE Design Automation Conference; 2024, Issue 61, p1550-1555, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 193975014
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PubType: Conference
PubTypeId: conference
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  Data: KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology.
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      – Type: doi
        Value: 10.1145/3649329.3657380
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 1550
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      – TitleFull: KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology.
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            NameFull: Xing, Wei W.
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            NameFull: Fan, Weijian
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            NameFull: Liu, Zhuohua
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            NameFull: Yao, Yuan
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              M: 01
              Text: 2024
              Type: published
              Y: 2024
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              Value: 61
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            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
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