APA (7th ed.) Citation

Xing, W. W., Liu, Y., Fan, W., & He, L. (2024). Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation. DAC: Annual ACM/IEEE Design Automation Conference, 61, 1556. https://doi.org/10.1145/3649329.3657381

Chicago Style (17th ed.) Citation

Xing, Wei W., Yanfang Liu, Weijian Fan, and Lei He. "Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation." DAC: Annual ACM/IEEE Design Automation Conference 61 (2024): 1556. https://doi.org/10.1145/3649329.3657381.

MLA (9th ed.) Citation

Xing, Wei W., et al. "Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation." DAC: Annual ACM/IEEE Design Automation Conference, 61, 2024, p. 1556, https://doi.org/10.1145/3649329.3657381.