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Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation.

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Title: Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation.
Authors: Xing, Wei W.1, wxingphd@gmail.com, Liu, Yanfang2, liuyanfang@buaa.edu.cn, Fan, Weijian3,4, fanweijian2021@email.szu.edu.cn, He, Lei3,5, lhe@eitech.edu.cn
Source: DAC: Annual ACM/IEEE Design Automation Conference; 2024, Issue 61, p1556-1561, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 193975015
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PubType: Conference
PubTypeId: conference
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  Data: Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation.
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  Data: <searchLink fieldCode="AU" term="%22Xing%2C+Wei+W%2E%22">Xing, Wei W.</searchLink><relatesTo>1</relatesTo>, <i>wxingphd@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Liu%2C+Yanfang%22">Liu, Yanfang</searchLink><relatesTo>2</relatesTo>, <i>liuyanfang@buaa.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Fan%2C+Weijian%22">Fan, Weijian</searchLink><relatesTo>3,4</relatesTo>, <i>fanweijian2021@email.szu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22He%2C+Lei%22">He, Lei</searchLink><relatesTo>3,5</relatesTo>, <i>lhe@eitech.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; 2024, Issue 61, p1556-1561, 6p
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        Value: 10.1145/3649329.3657381
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      – Code: eng
        Text: English
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        StartPage: 1556
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      – TitleFull: Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Estimation.
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            NameFull: Xing, Wei W.
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            NameFull: Liu, Yanfang
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            NameFull: Fan, Weijian
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              Text: 2024
              Type: published
              Y: 2024
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              Value: 61
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