APA (7th ed.) Citation

Qin, H., Kou, J., Zhang, L., Kang, W., & Xing, W. W. (2025). Multi-Agent Yield Analysis For Circuit Design. DAC: Annual ACM/IEEE Design Automation Conference, 62, 1.

Chicago Style (17th ed.) Citation

Qin, Haiyan, Jing Kou, Liang Zhang, Wang Kang, and Wei W. Xing. "Multi-Agent Yield Analysis For Circuit Design." DAC: Annual ACM/IEEE Design Automation Conference 62 (2025): 1.

MLA (9th ed.) Citation

Qin, Haiyan, et al. "Multi-Agent Yield Analysis For Circuit Design." DAC: Annual ACM/IEEE Design Automation Conference, 62, 2025, p. 1.