Impact of lateral scaling on the electrical characteristics of AlGaN/GaN HEMTs.
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| Title: | Impact of lateral scaling on the electrical characteristics of AlGaN/GaN HEMTs. |
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| Authors: | Jung, Hyun‐Wook1,2, Choi, Il‐Gyu1, Kim, Dohyun1, Chang, Sung‐Jae1, Ahn, Ho‐Kyun1, Lim, Jong‐Won1, Kang, Dong Min1, Won, Sang Min2, sangminwon@skku.edu |
| Source: | ETRI Journal; Jun2026, Vol. 48 Issue 3, p532-543, 12p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 194609603 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Impact of lateral scaling on the electrical characteristics of AlGaN/GaN HEMTs. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Jung%2C+Hyun‐Wook%22">Jung, Hyun‐Wook</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Choi%2C+Il‐Gyu%22">Choi, Il‐Gyu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dohyun%22">Kim, Dohyun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chang%2C+Sung‐Jae%22">Chang, Sung‐Jae</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Ahn%2C+Ho‐Kyun%22">Ahn, Ho‐Kyun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lim%2C+Jong‐Won%22">Lim, Jong‐Won</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kang%2C+Dong+Min%22">Kang, Dong Min</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Won%2C+Sang+Min%22">Won, Sang Min</searchLink><relatesTo>2</relatesTo>, <i>sangminwon@skku.edu</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22ETRI+Journal%22">ETRI Journal</searchLink>; Jun2026, Vol. 48 Issue 3, p532-543, 12p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194609603 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.4218/etrij.2025-0109 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 532 Titles: – TitleFull: Impact of lateral scaling on the electrical characteristics of AlGaN/GaN HEMTs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jung, Hyun‐Wook – PersonEntity: Name: NameFull: Choi, Il‐Gyu – PersonEntity: Name: NameFull: Kim, Dohyun – PersonEntity: Name: NameFull: Chang, Sung‐Jae – PersonEntity: Name: NameFull: Ahn, Ho‐Kyun – PersonEntity: Name: NameFull: Lim, Jong‐Won – PersonEntity: Name: NameFull: Kang, Dong Min – PersonEntity: Name: NameFull: Won, Sang Min IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 12256463 Numbering: – Type: volume Value: 48 – Type: issue Value: 3 Titles: – TitleFull: ETRI Journal Type: main |
| ResultId | 1 |