APA (7th ed.) Citation

Choi, Y., Yang, H., Kim, H. J., Park, S., Lee, Y. J., Choi, S., . . . Bae, J. (2026). Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors. Applied Physics Letters, 128(24), 1. https://doi.org/10.1063/5.0332203

Chicago Style (17th ed.) Citation

Choi, Yubin, et al. "Characterization of Trap Dynamics via Transient Response in Amorphous InGaZnO Thin-film Transistors." Applied Physics Letters 128, no. 24 (2026): 1. https://doi.org/10.1063/5.0332203.

MLA (9th ed.) Citation

Choi, Yubin, et al. "Characterization of Trap Dynamics via Transient Response in Amorphous InGaZnO Thin-film Transistors." Applied Physics Letters, vol. 128, no. 24, 2026, p. 1, https://doi.org/10.1063/5.0332203.