Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors.
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| Title: | Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors. |
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| Authors: | Choi, Yubin1, Yang, Hyojin1, Kim, Hwan Jin1, Park, Sejun1, Lee, Yoon Jung1, Choi, Sung-Jin1, Kim, Dae Hwan1, Kim, Dong Myong2, Kim, Haesung3, kim5425@purdue.edu, Bae, Jong-Ho4, kim5425@purdue.edu |
| Source: | Applied Physics Letters; 6/15/2026, Vol. 128 Issue 24, p1-6, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/5.0332203 |
