Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors.

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Title: Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors.
Authors: Choi, Yubin1, Yang, Hyojin1, Kim, Hwan Jin1, Park, Sejun1, Lee, Yoon Jung1, Choi, Sung-Jin1, Kim, Dae Hwan1, Kim, Dong Myong2, Kim, Haesung3, kim5425@purdue.edu, Bae, Jong-Ho4, kim5425@purdue.edu
Source: Applied Physics Letters; 6/15/2026, Vol. 128 Issue 24, p1-6, 6p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 194702584
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PubTypeId: academicJournal
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  Data: Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors.
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  Data: <searchLink fieldCode="AU" term="%22Choi%2C+Yubin%22">Choi, Yubin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Hyojin%22">Yang, Hyojin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Hwan+Jin%22">Kim, Hwan Jin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Park%2C+Sejun%22">Park, Sejun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lee%2C+Yoon+Jung%22">Lee, Yoon Jung</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Choi%2C+Sung-Jin%22">Choi, Sung-Jin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dae+Hwan%22">Kim, Dae Hwan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dong+Myong%22">Kim, Dong Myong</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Haesung%22">Kim, Haesung</searchLink><relatesTo>3</relatesTo>, <i>kim5425@purdue.edu</i><br /><searchLink fieldCode="AU" term="%22Bae%2C+Jong-Ho%22">Bae, Jong-Ho</searchLink><relatesTo>4</relatesTo>, <i>kim5425@purdue.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 6/15/2026, Vol. 128 Issue 24, p1-6, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194702584
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        Value: 10.1063/5.0332203
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              Text: 6/15/2026
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