Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors.
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| Title: | Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors. |
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| Authors: | Choi, Yubin1, Yang, Hyojin1, Kim, Hwan Jin1, Park, Sejun1, Lee, Yoon Jung1, Choi, Sung-Jin1, Kim, Dae Hwan1, Kim, Dong Myong2, Kim, Haesung3, kim5425@purdue.edu, Bae, Jong-Ho4, kim5425@purdue.edu |
| Source: | Applied Physics Letters; 6/15/2026, Vol. 128 Issue 24, p1-6, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 194702584 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Choi%2C+Yubin%22">Choi, Yubin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Hyojin%22">Yang, Hyojin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Hwan+Jin%22">Kim, Hwan Jin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Park%2C+Sejun%22">Park, Sejun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lee%2C+Yoon+Jung%22">Lee, Yoon Jung</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Choi%2C+Sung-Jin%22">Choi, Sung-Jin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dae+Hwan%22">Kim, Dae Hwan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Dong+Myong%22">Kim, Dong Myong</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kim%2C+Haesung%22">Kim, Haesung</searchLink><relatesTo>3</relatesTo>, <i>kim5425@purdue.edu</i><br /><searchLink fieldCode="AU" term="%22Bae%2C+Jong-Ho%22">Bae, Jong-Ho</searchLink><relatesTo>4</relatesTo>, <i>kim5425@purdue.edu</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 6/15/2026, Vol. 128 Issue 24, p1-6, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194702584 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/5.0332203 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 1 Titles: – TitleFull: Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Choi, Yubin – PersonEntity: Name: NameFull: Yang, Hyojin – PersonEntity: Name: NameFull: Kim, Hwan Jin – PersonEntity: Name: NameFull: Park, Sejun – PersonEntity: Name: NameFull: Lee, Yoon Jung – PersonEntity: Name: NameFull: Choi, Sung-Jin – PersonEntity: Name: NameFull: Kim, Dae Hwan – PersonEntity: Name: NameFull: Kim, Dong Myong – PersonEntity: Name: NameFull: Kim, Haesung – PersonEntity: Name: NameFull: Bae, Jong-Ho IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 06 Text: 6/15/2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 00036951 Numbering: – Type: volume Value: 128 – Type: issue Value: 24 Titles: – TitleFull: Applied Physics Letters Type: main |
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