Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors. - Choi, Yubin; Yang, Hyojin; Kim, Hwan Jin; Park, Sejun; Lee, Yoon Jung; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong; Kim, Haesung; Bae, Jong-Ho (Applied Physics Letters, 2026)