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ESD performance of 65nm partially depleted n and p channel SOI MOSFETs

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Bibliographic Details
Title: ESD performance of 65nm partially depleted n and p channel SOI MOSFETs
Authors: Mishra, R.1,2, rmishra@us.ibm.com, Ioannou, D.E.1, Mitra, S.2, Gauthier, R.2, Seguin, C.2, Halbach, R.2
Source: Solid-State Electronics; Apr2010, Vol. 54 Issue 4, p357-361, 5p
Database: Applied Science & Technology Source
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