Characteristics of Hebbian-type associative memories having faulty interconnections.

Saved in:
Bibliographic Details
Title: Characteristics of Hebbian-type associative memories having faulty interconnections.
Authors: Chung, Pau-Choo, Krile, Thomas F.
Source: IEEE Transactions on Neural Networks; November 1992, Vol. 3, p969-980, 12p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first