Manessis, D., Du, H., & Larker, R. (1998). Oxide and interface characteristics of oxidized silicon oxynitride ceramics—an investigation by electron microscopy. Journal of Materials Science, 33(17), 4447. https://doi.org/10.1023/A:1026449331258
Chicago Style (17th ed.) CitationManessis, D., Honghua Du, and R. Larker. "Oxide and Interface Characteristics of Oxidized Silicon Oxynitride Ceramics—an Investigation by Electron Microscopy." Journal of Materials Science 33, no. 17 (1998): 4447. https://doi.org/10.1023/A:1026449331258.
MLA (9th ed.) CitationManessis, D., et al. "Oxide and Interface Characteristics of Oxidized Silicon Oxynitride Ceramics—an Investigation by Electron Microscopy." Journal of Materials Science, vol. 33, no. 17, 1998, p. 4447, https://doi.org/10.1023/A:1026449331258.