Connell, J. D. (1997). An introduction to boundary scan testing. Electronics Now, 68, 49.
Chicago Style (17th ed.) CitationConnell, J. Daniel. "An Introduction to Boundary Scan Testing." Electronics Now 68 (1997): 49.
MLA (9th ed.) CitationConnell, J. Daniel. "An Introduction to Boundary Scan Testing." Electronics Now, vol. 68, 1997, p. 49.
Warning: These citations may not always be 100% accurate.