An introduction to boundary scan testing.
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| Title: | An introduction to boundary scan testing. |
|---|---|
| Authors: | Connell, J. Daniel |
| Source: | Electronics Now; Jun97, Vol. 68, p49-55, 7p |
| Database: | Applied Science & Technology Source |
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| FullText | Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500462018 AccessLevel: 2 PubType: Periodical PubTypeId: serialPeriodical PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500462018 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 49 Titles: – TitleFull: An introduction to boundary scan testing. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Connell, J. Daniel IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun97 Type: published Y: 1997 Identifiers: – Type: issn-print Value: 10679294 Numbering: – Type: volume Value: 68 Titles: – TitleFull: Electronics Now Type: main |
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