Rudd, M. E. (1997). Spurious electrons in electron spectrometers and their effect on differential electron impact ionization cross-section measurements. Review of Scientific Instruments, 68, 3014. https://doi.org/10.1063/1.1148234
Chicago Style (17th ed.) CitationRudd, M. E. "Spurious Electrons in Electron Spectrometers and Their Effect on Differential Electron Impact Ionization Cross-section Measurements." Review of Scientific Instruments 68 (1997): 3014. https://doi.org/10.1063/1.1148234.
MLA (9th ed.) CitationRudd, M. E. "Spurious Electrons in Electron Spectrometers and Their Effect on Differential Electron Impact Ionization Cross-section Measurements." Review of Scientific Instruments, vol. 68, 1997, p. 3014, https://doi.org/10.1063/1.1148234.