Spurious electrons in electron spectrometers and their effect on differential electron impact ionization cross-section measurements.

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Title: Spurious electrons in electron spectrometers and their effect on differential electron impact ionization cross-section measurements.
Authors: Rudd, M. E.
Source: Review of Scientific Instruments; August 1997, Vol. 68, p3014-3018, 5p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 500481900
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PubType: Academic Journal
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      – Type: doi
        Value: 10.1063/1.1148234
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 3014
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      – TitleFull: Spurious electrons in electron spectrometers and their effect on differential electron impact ionization cross-section measurements.
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            – D: 01
              M: 08
              Text: August 1997
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              Y: 1997
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              Value: 68
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