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Measurement of the zero-bias electron transmittance as a function of energy for half- and quarter-electron-wavelength semiconductor quantum-interference filters.

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Title: Measurement of the zero-bias electron transmittance as a function of energy for half- and quarter-electron-wavelength semiconductor quantum-interference filters.
Authors: Guthrie, D. K., First, P. N., Gaylord, T. K.
Source: Applied Physics Letters; January 19 1998, Vol. 72, p374-376, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500557635
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Measurement of the zero-bias electron transmittance as a function of energy for half- and quarter-electron-wavelength semiconductor quantum-interference filters.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; January 19 1998, Vol. 72, p374-376, 3p
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        Value: 10.1063/1.120741
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        Text: English
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        PageCount: 3
        StartPage: 374
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      – TitleFull: Measurement of the zero-bias electron transmittance as a function of energy for half- and quarter-electron-wavelength semiconductor quantum-interference filters.
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              Text: January 19 1998
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