Brunner, R., Marti, O., & Hollricher, O. (1999). Influence of environmental conditions on shear-force distance control in near-field optical microscopy. Journal of Applied Physics, 86(12), 7100. https://doi.org/10.1063/1.371798
Chicago Style (17th ed.) CitationBrunner, R., O. Marti, and O. Hollricher. "Influence of Environmental Conditions on Shear-force Distance Control in Near-field Optical Microscopy." Journal of Applied Physics 86, no. 12 (1999): 7100. https://doi.org/10.1063/1.371798.
MLA (9th ed.) CitationBrunner, R., et al. "Influence of Environmental Conditions on Shear-force Distance Control in Near-field Optical Microscopy." Journal of Applied Physics, vol. 86, no. 12, 1999, p. 7100, https://doi.org/10.1063/1.371798.
Warning: These citations may not always be 100% accurate.