Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs.
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| Title: | Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs. |
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| Authors: | Reichert, W., Cohen, R. M. |
| Source: | Journal of Electronic Materials; January 2000, Vol. 29 Issue 1, p118-128, 11p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500625797 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500625797 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11664-000-0106-4 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 118 Titles: – TitleFull: Effects of substrate orientation and surface reconstruction on patterned substrate OMVPE of GaAs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Reichert, W. – PersonEntity: Name: NameFull: Cohen, R. M. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: January 2000 Type: published Y: 2000 Identifiers: – Type: issn-print Value: 03615235 Numbering: – Type: volume Value: 29 – Type: issue Value: 1 Titles: – TitleFull: Journal of Electronic Materials Type: main |
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