Bhattacharya, M., & Mazumder, P. (2000). Noise margins of threshold logic gates containing resonant tunneling diodes. IEEE Transactions on Circuits & Systems. Part II: Express Briefs, 47(10), 1080.
Chicago Style (17th ed.) CitationBhattacharya, M., and P. Mazumder. "Noise Margins of Threshold Logic Gates Containing Resonant Tunneling Diodes." IEEE Transactions on Circuits & Systems. Part II: Express Briefs 47, no. 10 (2000): 1080.
MLA (9th ed.) CitationBhattacharya, M., and P. Mazumder. "Noise Margins of Threshold Logic Gates Containing Resonant Tunneling Diodes." IEEE Transactions on Circuits & Systems. Part II: Express Briefs, vol. 47, no. 10, 2000, p. 1080.
Warning: These citations may not always be 100% accurate.
