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Noise margins of threshold logic gates containing resonant tunneling diodes.

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Bibliographic Details
Title: Noise margins of threshold logic gates containing resonant tunneling diodes.
Authors: Bhattacharya, M., Mazumder, P.
Source: IEEE Transactions on Circuits & Systems. Part II: Express Briefs; October 2000, Vol. 47 Issue 10, p1080-1085, 6p
Database: Applied Science & Technology Source
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