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Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate.

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Title: Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate.
Authors: Obayashi, Y., Shintani, K.
Source: Journal of Applied Physics; July 1 2000, Vol. 88 Issue 1, p105-114, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500708107
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; July 1 2000, Vol. 88 Issue 1, p105-114, 10p
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      – Type: doi
        Value: 10.1063/1.373630
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 105
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      – TitleFull: Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate.
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            NameFull: Obayashi, Y.
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            NameFull: Shintani, K.
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              Text: July 1 2000
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              Y: 2000
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              Value: 88
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