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Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate.

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Bibliographic Details
Title: Critical thickness of a heteroepitaxial film on a twist-bonded compliant substrate.
Authors: Obayashi, Y., Shintani, K.
Source: Journal of Applied Physics; July 1 2000, Vol. 88 Issue 1, p105-114, 10p
Database: Applied Science & Technology Source
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