APA (7th ed.) Citation

Timans, P. J., Nényei, Z., & Berger, R. (2002). Device scaling drives pattern effect solutions. Solid State Technology, 45(5), 67.

Chicago Style (17th ed.) Citation

Timans, P. J., Z. Nényei, and R. Berger. "Device Scaling Drives Pattern Effect Solutions." Solid State Technology 45, no. 5 (2002): 67.

MLA (9th ed.) Citation

Timans, P. J., et al. "Device Scaling Drives Pattern Effect Solutions." Solid State Technology, vol. 45, no. 5, 2002, p. 67.