Usami, N., Ichitsubo, T., & Ujihara, T. (2003). Influence of the elastic strain on the band structure of ellipsoidal SiGe coherently embedded in the Si matrix. Journal of Applied Physics, 94(2), 916. https://doi.org/10.1063/1.1580194
Chicago Style (17th ed.) CitationUsami, Noritaka, Tetsu Ichitsubo, and Toru Ujihara. "Influence of the Elastic Strain on the Band Structure of Ellipsoidal SiGe Coherently Embedded in the Si Matrix." Journal of Applied Physics 94, no. 2 (2003): 916. https://doi.org/10.1063/1.1580194.
MLA (9th ed.) CitationUsami, Noritaka, et al. "Influence of the Elastic Strain on the Band Structure of Ellipsoidal SiGe Coherently Embedded in the Si Matrix." Journal of Applied Physics, vol. 94, no. 2, 2003, p. 916, https://doi.org/10.1063/1.1580194.