APA (7th ed.) Citation

Kita, T., Kakutani, T., & Wada, O. (2003). Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers. Journal of Applied Physics, 94(10), 6487. https://doi.org/10.1063/1.1623327

Chicago Style (17th ed.) Citation

Kita, T., T. Kakutani, and O. Wada. "Fourier Transformed Photoreflectance Characterization of Interface Electric Fields in GaAs/GaInP Heterojunction Bipolar Transistor Wafers." Journal of Applied Physics 94, no. 10 (2003): 6487. https://doi.org/10.1063/1.1623327.

MLA (9th ed.) Citation

Kita, T., et al. "Fourier Transformed Photoreflectance Characterization of Interface Electric Fields in GaAs/GaInP Heterojunction Bipolar Transistor Wafers." Journal of Applied Physics, vol. 94, no. 10, 2003, p. 6487, https://doi.org/10.1063/1.1623327.