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Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.

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Bibliographic Details
Title: Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.
Authors: Kita, T., Kakutani, T., Wada, O.
Source: Journal of Applied Physics; November 15 2003, Vol. 94 Issue 10, p6487-6490, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500918251
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.
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  Data: <searchLink fieldCode="AU" term="%22Kita%2C+T%2E%22">Kita, T.</searchLink><br /><searchLink fieldCode="AU" term="%22Kakutani%2C+T%2E%22">Kakutani, T.</searchLink><br /><searchLink fieldCode="AU" term="%22Wada%2C+O%2E%22">Wada, O.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; November 15 2003, Vol. 94 Issue 10, p6487-6490, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500918251
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      – Type: doi
        Value: 10.1063/1.1623327
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: 6487
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      – TitleFull: Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers.
        Type: main
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            NameFull: Kita, T.
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            NameFull: Kakutani, T.
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            NameFull: Wada, O.
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              Text: November 15 2003
              Type: published
              Y: 2003
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