APA (7th ed.) Citation

Glanemann, M., Axt, V. M., & Kuhn, T. (2004). Thermal escape and capture processes in quantum wire-dot structures. Semiconductor Science & Technology, 19(4), S229. https://doi.org/10.1088/0268-1242/19/4/077

Chicago Style (17th ed.) Citation

Glanemann, M., V. M. Axt, and T. Kuhn. "Thermal Escape and Capture Processes in Quantum Wire-dot Structures." Semiconductor Science & Technology 19, no. 4 (2004): S229. https://doi.org/10.1088/0268-1242/19/4/077.

MLA (9th ed.) Citation

Glanemann, M., et al. "Thermal Escape and Capture Processes in Quantum Wire-dot Structures." Semiconductor Science & Technology, vol. 19, no. 4, 2004, p. S229, https://doi.org/10.1088/0268-1242/19/4/077.