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Thermal escape and capture processes in quantum wire-dot structures.

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Bibliographic Details
Title: Thermal escape and capture processes in quantum wire-dot structures.
Authors: Glanemann, M., Axt, V. M., Kuhn, T.
Source: Semiconductor Science & Technology; Apr2004, Vol. 19 Issue 4, pS229-S231, 3p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500969803
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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        Value: 10.1088/0268-1242/19/4/077
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        Text: English
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        PageCount: 3
        StartPage: S229
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      – TitleFull: Thermal escape and capture processes in quantum wire-dot structures.
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              Text: Apr2004
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              Y: 2004
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