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Thermal escape and capture processes in quantum wire-dot structures.

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Bibliographic Details
Title: Thermal escape and capture processes in quantum wire-dot structures.
Authors: Glanemann, M., Axt, V. M., Kuhn, T.
Source: Semiconductor Science & Technology; Apr2004, Vol. 19 Issue 4, pS229-S231, 3p
Database: Applied Science & Technology Source
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