Effect of Stochastic Dead Space on Noise in Avalanche Photodiodes.
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| Title: | Effect of Stochastic Dead Space on Noise in Avalanche Photodiodes. |
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| Authors: | Kwon, Oh-Hyun, Hayat, Majeed M., Campbell, Joe C. |
| Source: | IEEE Transactions on Electron Devices; May2004, Vol. 51 Issue 5, p693-700, 8p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500987312 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500987312 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TED.2004.825798 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 693 Titles: – TitleFull: Effect of Stochastic Dead Space on Noise in Avalanche Photodiodes. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kwon, Oh-Hyun – PersonEntity: Name: NameFull: Hayat, Majeed M. – PersonEntity: Name: NameFull: Campbell, Joe C. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2004 Type: published Y: 2004 Identifiers: – Type: issn-print Value: 00189383 Numbering: – Type: volume Value: 51 – Type: issue Value: 5 Titles: – TitleFull: IEEE Transactions on Electron Devices Type: main |
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