Sawai, Y., Shibagaki, Y., & Ono, T. (2004). AE measuring system at high temperature for ceramics with low thermal expansion due to microcracking. Journal of Materials Science, 39(10), 3483. https://doi.org/10.1023/B:JMSC.0000026957.21183.35
Chicago Style (17th ed.) CitationSawai, Y., Y. Shibagaki, and T. Ono. "AE Measuring System at High Temperature for Ceramics with Low Thermal Expansion Due to Microcracking." Journal of Materials Science 39, no. 10 (2004): 3483. https://doi.org/10.1023/B:JMSC.0000026957.21183.35.
MLA (9th ed.) CitationSawai, Y., et al. "AE Measuring System at High Temperature for Ceramics with Low Thermal Expansion Due to Microcracking." Journal of Materials Science, vol. 39, no. 10, 2004, p. 3483, https://doi.org/10.1023/B:JMSC.0000026957.21183.35.