APA (7th ed.) Citation

Zhang, S. Y., Qin, G. B., & Zhuravlev, V. (2003). Design of an X-mode fast-scanning reflectometry for edge density profile measurement on HT-7 tokamak. Review of Scientific Instruments, 74(3), 1522. https://doi.org/10.1063/1.1527253

Chicago Style (17th ed.) Citation

Zhang, S. Y., G. B. Qin, and V. Zhuravlev. "Design of an X-mode Fast-scanning Reflectometry for Edge Density Profile Measurement on HT-7 Tokamak." Review of Scientific Instruments 74, no. 3 (2003): 1522. https://doi.org/10.1063/1.1527253.

MLA (9th ed.) Citation

Zhang, S. Y., et al. "Design of an X-mode Fast-scanning Reflectometry for Edge Density Profile Measurement on HT-7 Tokamak." Review of Scientific Instruments, vol. 74, no. 3, 2003, p. 1522, https://doi.org/10.1063/1.1527253.