Investigation of the fracture toughness of radio frequency magnetron sputtered Al-Cu-Fe films via white-beam synchrotron radiography/topography.

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Title: Investigation of the fracture toughness of radio frequency magnetron sputtered Al-Cu-Fe films via white-beam synchrotron radiography/topography.
Authors: French, B. L., Daniels, M. J., Bilello, J. C.
Source: Journal of Physics: D Applied Physics; May 21 2005, Vol. 38, pA44-A49, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501087164
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Investigation of the fracture toughness of radio frequency magnetron sputtered Al-Cu-Fe films via white-beam synchrotron radiography/topography.
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  Data: <searchLink fieldCode="AU" term="%22French%2C+B%2E+L%2E%22">French, B. L.</searchLink><br /><searchLink fieldCode="AU" term="%22Daniels%2C+M%2E+J%2E%22">Daniels, M. J.</searchLink><br /><searchLink fieldCode="AU" term="%22Bilello%2C+J%2E+C%2E%22">Bilello, J. C.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Physics%3A+D+Applied+Physics%22">Journal of Physics: D Applied Physics</searchLink>; May 21 2005, Vol. 38, pA44-A49, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501087164
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1088/0022-3727/38/10A/009
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: A44
    Titles:
      – TitleFull: Investigation of the fracture toughness of radio frequency magnetron sputtered Al-Cu-Fe films via white-beam synchrotron radiography/topography.
        Type: main
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            NameFull: French, B. L.
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            NameFull: Daniels, M. J.
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            NameFull: Bilello, J. C.
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            – D: 22
              M: 05
              Text: May 21 2005
              Type: published
              Y: 2005
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              Value: 38
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            – TitleFull: Journal of Physics: D Applied Physics
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