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Cluster trending analysis for control loop assessment and diagnosis.

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Bibliographic Details
Title: Cluster trending analysis for control loop assessment and diagnosis.
Authors: Dong, B. Ling, Venkataraman, U.
Source: IEE Computing & Control Engineering.; August/September 2005, Vol. 16 Issue 4, p40-46, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501125206
AccessLevel: 2
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Cluster trending analysis for control loop assessment and diagnosis.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Dong%2C+B%2E+Ling%22">Dong, B. Ling</searchLink><br /><searchLink fieldCode="AU" term="%22Venkataraman%2C+U%2E%22">Venkataraman, U.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEE+Computing+%26+Control+Engineering%2E%22">IEE Computing & Control Engineering.</searchLink>; August/September 2005, Vol. 16 Issue 4, p40-46, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501125206
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 40
    Titles:
      – TitleFull: Cluster trending analysis for control loop assessment and diagnosis.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Dong, B. Ling
      – PersonEntity:
          Name:
            NameFull: Venkataraman, U.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 08
              Text: August/September 2005
              Type: published
              Y: 2005
          Numbering:
            – Type: volume
              Value: 16
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: IEE Computing & Control Engineering.
              Type: main
ResultId 1